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Soft Matter Facility (SoMF)

Texas A&M University College of Engineering

Ellipsometer

Capabilities

  • Thickness range: 1 nm to 5 microns thickness
  • Max substrate thickness: 18 mm
  • Wavelength: 370-1000 nm, Angle range: 45-90 ˚
  • 5 ml Heated liquid cell available

Features

  • Analyze thin film’s structural and optical properties
  • Thickness, refractive index, segregation characters of multicomponent systems.

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